{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11954841","patent":{"patent_number":"US-11954841","title":"Optical inspection of a wafer","assignee":null,"inventors":[],"filing_date":"2022-06-03T00:00:00.000Z","publication_date":"2024-04-09T00:00:00.000Z","cpc_codes":["G01N","G06T","G01N","G06T","G06T","G06T","G06T","H04N","G06T"],"num_claims":20,"abstract":"An image analysis device may align an image to determine a position of a wafer within the image. The wafer may include a plurality of wafer bumps. The image analysis device may mask, based on the position of the wafer, the image to obtain an image of a portion of the wafer. The image analysis device may binarize the image of the portion of the wafer to create a binarized image of the portion of the wafer. The image analysis device may determine a bump pattern, associated with the plurality of wafer bumps, based on the binarized image of the portion of the wafer. The image analysis device may perform a defect analysis of the determined bump pattern. The defect analysis may be associated with detecting regions of the portion of the wafer in which one or more wafer bumps have abnormal bump heights."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Optical inspection of a wafer","description":"An image analysis device may align an image to determine a position of a wafer within the image. The wafer may include a plurality of wafer bumps. The image analysis device may mask, based on the posi","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11954841","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11954841","citation_suggestion":"Patentable. \"Optical inspection of a wafer\" (US-11954841). https://patentable.app/patents/US-11954841","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11954841","json":"https://patentable.app/api/llm-context/US-11954841","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T04:16:01.939Z"}