{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11959870","patent":{"patent_number":"US-11959870","title":"Differential probe with low-slope component","assignee":null,"inventors":[],"filing_date":"2022-01-05T00:00:00.000Z","publication_date":"2024-04-16T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G01N","G01N"],"num_claims":20,"abstract":"An embodiment provides a method for measuring an analyte of a sample, including: introducing a sample to a sample region of a measurement device; the measurement device comprising: a measurement electrode and a ground electrode contacting the sample; a low-slope reference electrode in a reference electrode assembly having an electrolyte solution, wherein the electrolyte solution is in contact with the low-slope reference electrode; wherein the electrolyte solution is electrically coupled to the sample via at least one junction; and measuring a first potential between the measurement electrode and the ground electrode; measuring a second potential between the low-slope reference electrode and the ground electrode; determining an analyte in the sample by comparing the first potential and the second potential. Other aspects are described and claimed."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Differential probe with low-slope component","description":"An embodiment provides a method for measuring an analyte of a sample, including: introducing a sample to a sample region of a measurement device; the measurement device comprising: a measurement elect","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11959870","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11959870","citation_suggestion":"Patentable. \"Differential probe with low-slope component\" (US-11959870). https://patentable.app/patents/US-11959870","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11959870","json":"https://patentable.app/api/llm-context/US-11959870","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T06:32:54.887Z"}