{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11960814","patent":{"patent_number":"US-11960814","title":"Wafer searching method and device","assignee":null,"inventors":[],"filing_date":"2021-09-01T00:00:00.000Z","publication_date":"2024-04-16T00:00:00.000Z","cpc_codes":["G06F","H01L","H01L","H01L"],"num_claims":16,"abstract":"The disclosure provides a wafer searching method and device. The method includes: obtaining a target wafer and a reference wafer; determining a first specific area in the target wafer, and obtaining a first significant distribution feature of the first specific area; determining a second specific area in the reference wafer, and obtaining a second significant distribution feature of the second specific area; in response to determining that the first significant distribution feature corresponds to the second significant distribution feature, estimating a fail pattern similarity between the first specific area and the second specific area; in response to determining that the fail pattern similarity is greater than a threshold, providing the reference wafer as a search result corresponding to the target wafer."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Wafer searching method and device","description":"The disclosure provides a wafer searching method and device. The method includes: obtaining a target wafer and a reference wafer; determining a first specific area in the target wafer, and obtaining a","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11960814","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11960814","citation_suggestion":"Patentable. \"Wafer searching method and device\" (US-11960814). https://patentable.app/patents/US-11960814","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11960814","json":"https://patentable.app/api/llm-context/US-11960814","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T03:24:27.834Z"}