{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11961700","patent":{"patent_number":"US-11961700","title":"Systems and methods for image enhancement for a multi-beam charged-particle inspection system","assignee":null,"inventors":[],"filing_date":"2020-03-25T00:00:00.000Z","publication_date":"2024-04-16T00:00:00.000Z","cpc_codes":["G06T","G06T","G06T","G06T","G06T"],"num_claims":15,"abstract":"Embodiments consistent with the disclosure herein include methods for image enhancement for a multi-beam charged-particle inspection system. Systems and methods consistent with the present disclosure include analyzing signal information representative of first and second images, wherein the first image is associated with a first beam of a set of beams and the second image is associated with a second beam of the set of beams; detecting, based on the analysis, disturbances in positioning of the first and second beams in relation to a sample; obtaining an image of the sample using the signal information of the first and second beams; and correcting the image of the sample using the identified disturbances."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Systems and methods for image enhancement for a multi-beam charged-particle inspection system","description":"Embodiments consistent with the disclosure herein include methods for image enhancement for a multi-beam charged-particle inspection system. Systems and methods consistent with the present disclosure ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11961700","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11961700","citation_suggestion":"Patentable. \"Systems and methods for image enhancement for a multi-beam charged-particle inspection system\" (US-11961700). https://patentable.app/patents/US-11961700","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11961700","json":"https://patentable.app/api/llm-context/US-11961700","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T03:23:56.459Z"}