{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11965735","patent":{"patent_number":"US-11965735","title":"Thickness measurement method, thickness measurement device, defect detection method, and defect detection device","assignee":null,"inventors":[],"filing_date":"2021-08-06T00:00:00.000Z","publication_date":"2024-04-23T00:00:00.000Z","cpc_codes":["G01N"],"num_claims":11,"abstract":"A thickness measurement method includes: heating a surface of the measurement object in a dot shape by a heating device; generating a thermal image corresponding to a temperature of the surface of the measurement object by capturing an image of the heated surface of the measurement object at a predetermined time interval by an imaging device; acquiring temperature data indicating temporal changes in temperature at multiple positions on the surface of the measurement object based on the thermal image generated by the imaging device; fitting a solution function indicating a solution of a heat conduction equation corresponding to a point heat source and including a parameter related to the thickness of the measurement object to the temperature data; and calculating the thickness of the measurement object based on a value of the parameter in the fitted solution function."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Thickness measurement method, thickness measurement device, defect detection method, and defect detection device","description":"A thickness measurement method includes: heating a surface of the measurement object in a dot shape by a heating device; generating a thermal image corresponding to a temperature of the surface of the","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11965735","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11965735","citation_suggestion":"Patentable. \"Thickness measurement method, thickness measurement device, defect detection method, and defect detection device\" (US-11965735). https://patentable.app/patents/US-11965735","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11965735","json":"https://patentable.app/api/llm-context/US-11965735","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T00:15:16.799Z"}