{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11965899","patent":{"patent_number":"US-11965899","title":"Calibration curve setting method, specimen analysis method, calibration curve setting program, specimen analysis program, and specimen analyzer","assignee":null,"inventors":[],"filing_date":"2021-08-31T00:00:00.000Z","publication_date":"2024-04-23T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N"],"num_claims":13,"abstract":"Disclosed is a calibration curve setting method for setting a calibration curve, the calibration curve setting method including: creating a first calibration curve on the basis of a measurement value obtained by measuring a standard sample for which a concentration of a predetermined component is known; creating a second calibration curve by correcting the created first calibration curve; displaying a screen configured to support an operator for restoring the second calibration curve to the first calibration curve; receiving an instruction of restoring the second calibration curve to the first calibration curve; and displaying the first calibration curve upon receiving the instruction of restoring."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Calibration curve setting method, specimen analysis method, calibration curve setting program, specimen analysis program, and specimen analyzer","description":"Disclosed is a calibration curve setting method for setting a calibration curve, the calibration curve setting method including: creating a first calibration curve on the basis of a measurement value ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11965899","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11965899","citation_suggestion":"Patentable. \"Calibration curve setting method, specimen analysis method, calibration curve setting program, specimen analysis program, and specimen analyzer\" (US-11965899). https://patentable.app/patents/US-11965899","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11965899","json":"https://patentable.app/api/llm-context/US-11965899","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T01:54:12.353Z"}