{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11965927","patent":{"patent_number":"US-11965927","title":"Systems and methods of testing adverse device conditions","assignee":null,"inventors":[],"filing_date":"2019-09-05T00:00:00.000Z","publication_date":"2024-04-23T00:00:00.000Z","cpc_codes":["G06F","G06F"],"num_claims":18,"abstract":"Thermal conditions can be simulated for an electronic device. Application developers may want to test how applications perform under various thermal conditions on a device that includes thermal management. The application developers can use the tests to determine whether the application should take proactive measures to maintain application performance, and which proactive measures should be taken. For example, an application can reduce its use of resources to ensure that an application maintains a desired quality of user experience (and at a minimum remains responsive) under adverse thermal conditions. Creating adverse conditions can be difficult to replicate, costly to implement, and can potential cause damage to the electronic device being tested. In some examples, simulating thermal conditions can be used instead of placing the device in real-world adverse conditions to improve the testing process for developers."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Systems and methods of testing adverse device conditions","description":"Thermal conditions can be simulated for an electronic device. Application developers may want to test how applications perform under various thermal conditions on a device that includes thermal manage","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11965927","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11965927","citation_suggestion":"Patentable. \"Systems and methods of testing adverse device conditions\" (US-11965927). https://patentable.app/patents/US-11965927","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11965927","json":"https://patentable.app/api/llm-context/US-11965927","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T11:54:10.176Z"}