{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11967537","patent":{"patent_number":"US-11967537","title":"Semiconductor apparatus and semiconductor apparatus leak inspection method","assignee":null,"inventors":[],"filing_date":"2018-11-13T00:00:00.000Z","publication_date":"2024-04-23T00:00:00.000Z","cpc_codes":["H01L","H01L","H01L","H01L","H01L","H01L"],"num_claims":16,"abstract":"A semiconductor device, a leak detection device, an outer wall, and a separation wall are provided on a substrate. A first hollow structure in contact with the semiconductor device and a second hollow structure in contact with the leak detection device are separated by the separation wall and formed in a hermetically sealed state. At least a part of a portion of the leak detection device in contact with the second hollow structure is made of a corrodible metal or an alloy containing a corrodible metal. At least a part of the outer wall is in contact with the second hollow structure."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor apparatus and semiconductor apparatus leak inspection method","description":"A semiconductor device, a leak detection device, an outer wall, and a separation wall are provided on a substrate. A first hollow structure in contact with the semiconductor device and a second hollow","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11967537","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11967537","citation_suggestion":"Patentable. \"Semiconductor apparatus and semiconductor apparatus leak inspection method\" (US-11967537). https://patentable.app/patents/US-11967537","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11967537","json":"https://patentable.app/api/llm-context/US-11967537","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T00:17:31.144Z"}