{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11972548","patent":{"patent_number":"US-11972548","title":"Computer-implemented method for defect analysis, apparatus for defect analysis, computer-program product, and intelligent defect analysis system","assignee":null,"inventors":[],"filing_date":"2020-12-03T00:00:00.000Z","publication_date":"2024-04-30T00:00:00.000Z","cpc_codes":["G06T","G06T","G06F","G06T","G06V","G06V","G06V","G06V"],"num_claims":17,"abstract":"A computer-implemented method for defect analysis is provided. The computer-implemented method includes obtaining a plurality of sets of defect point coordinates, a respective set of the plurality of sets of detect point coordinates including coordinates of defect points in a respective substrate of a plurality of substrates, the coordinates of defect points in the respective substrate being coordinates in an image coordinate system; combining the plurality of sets of defect point coordinates according to the image coordinate system into a composite set of coordinates to generate a composite image; and performing a clustering analysis to classify defect points in the composite set in the composite image into a plurality of clusters."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Computer-implemented method for defect analysis, apparatus for defect analysis, computer-program product, and intelligent defect analysis system","description":"A computer-implemented method for defect analysis is provided. The computer-implemented method includes obtaining a plurality of sets of defect point coordinates, a respective set of the plurality of ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11972548","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11972548","citation_suggestion":"Patentable. \"Computer-implemented method for defect analysis, apparatus for defect analysis, computer-program product, and intelligent defect analysis system\" (US-11972548). https://patentable.app/patents/US-11972548","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11972548","json":"https://patentable.app/api/llm-context/US-11972548","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T04:20:01.953Z"}