{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11972552","patent":{"patent_number":"US-11972552","title":"Abnormal wafer image classification","assignee":null,"inventors":[],"filing_date":"2021-04-22T00:00:00.000Z","publication_date":"2024-04-30T00:00:00.000Z","cpc_codes":["G06T","G06F","G06F","G06N","G06N","G06N","G06N","G06V","G06V","G06V","G06N","G06T","G06T","G06T"],"num_claims":20,"abstract":"A semiconductor image classifier. Convolution functions are applied to modify the wafer images in order to extract key information about the image. The modified images are condensed then processed through a series of pairwise classifiers, each classifier configured to determine that the image is more like one of the pair than the other. Probabilities from each classifier are collected to form a prediction for each image."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Abnormal wafer image classification","description":"A semiconductor image classifier. Convolution functions are applied to modify the wafer images in order to extract key information about the image. The modified images are condensed then processed thr","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11972552","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11972552","citation_suggestion":"Patentable. \"Abnormal wafer image classification\" (US-11972552). https://patentable.app/patents/US-11972552","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11972552","json":"https://patentable.app/api/llm-context/US-11972552","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T14:42:59.321Z"}