{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11975963","patent":{"patent_number":"US-11975963","title":"Microelectromechanical systems (“MEMS”) device having a built-in self-test (“BIST”) and a method of application of a BIST to measure MEMS health","assignee":null,"inventors":[],"filing_date":"2021-04-16T00:00:00.000Z","publication_date":"2024-05-07T00:00:00.000Z","cpc_codes":["H04R","H04R","H04R","H04R","H04R","H04R","H04R"],"num_claims":8,"abstract":"A microelectromechanical systems (MEMS) device includes a MEMS die and an electrical circuit electrically connected to the MEMS die. The electrical circuit includes a first capacitor that produces a first output signal based on a signal received from the MEMS die, and a second capacitor that produces a second output signal based on a signal received from the MEMS die. The electrical circuit is configured to determine a nominal capacitance of the MEMS die based on a ratio of the first output signal to the second output signal and a ratio of the capacitances of the first and second capacitors."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Microelectromechanical systems (“MEMS”) device having a built-in self-test (“BIST”) and a method of application of a BIST to measure MEMS health","description":"A microelectromechanical systems (MEMS) device includes a MEMS die and an electrical circuit electrically connected to the MEMS die. The electrical circuit includes a first capacitor that produces a f","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11975963","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11975963","citation_suggestion":"Patentable. \"Microelectromechanical systems (“MEMS”) device having a built-in self-test (“BIST”) and a method of application of a BIST to measure MEMS health\" (US-11975963). https://patentable.app/patents/US-11975963","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11975963","json":"https://patentable.app/api/llm-context/US-11975963","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T02:40:23.519Z"}