{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11977040","patent":{"patent_number":"US-11977040","title":"Methods, circuits and systems for obtaining impedance or dielectric measurements of a material under test","assignee":null,"inventors":[],"filing_date":"2023-02-15T00:00:00.000Z","publication_date":"2024-05-07T00:00:00.000Z","cpc_codes":["G01N","G01N"],"num_claims":17,"abstract":"Certain disclosed methods include: transmitting an excitation signal into the MUT and transmitting a reference signal to a set of magnitude and phase (M/P) detectors; receiving the response signal; separately comparing a magnitude and phase for each of the excitation signal and the reference signal with corresponding detection ranges for a first one of the M/P detectors; separately comparing a magnitude and phase for each of the response signal and the reference signal with corresponding detection ranges for a second one of the M/P detectors; iteratively adjusting the excitation signal until the response signal has both a magnitude and a phase within the corresponding detection ranges for the second M/P detector; and iteratively adjusting the reference signal until the reference signal has both a magnitude and a phase within the corresponding detection ranges for the first and the second M/P detectors."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Methods, circuits and systems for obtaining impedance or dielectric measurements of a material under test","description":"Certain disclosed methods include: transmitting an excitation signal into the MUT and transmitting a reference signal to a set of magnitude and phase (M/P) detectors; receiving the response signal; se","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11977040","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11977040","citation_suggestion":"Patentable. \"Methods, circuits and systems for obtaining impedance or dielectric measurements of a material under test\" (US-11977040). https://patentable.app/patents/US-11977040","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11977040","json":"https://patentable.app/api/llm-context/US-11977040","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T06:57:08.737Z"}