{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11977463","patent":{"patent_number":"US-11977463","title":"Semiconductor device and test method thereof, and non-transitory computer readable medium","assignee":null,"inventors":[],"filing_date":"2022-06-15T00:00:00.000Z","publication_date":"2024-05-07T00:00:00.000Z","cpc_codes":["G06F","G06F","G11C"],"num_claims":17,"abstract":"According to a certain embodiment, the semiconductor device includes: an integrated circuit unit; a command control unit configured to execute command control for the integrated circuit unit on the basis of a command, an address, and/or data, each supplied from an outside; an internal state control unit configured to detect an operating state inside the integrated circuit unit, and to provide an internal state signal indicating a first state or a second state in accordance with the detected operating state; and an instruction rejection control unit configured to instruct the internal state control unit to compulsorily turn the internal state signal to the first state if an operation of the integrated circuit unit has not been completed even after a predetermined maximum monitoring time has elapsed, and to instructs the command control unit to reject an input/output operation of the command, the address, and/or the data."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor device and test method thereof, and non-transitory computer readable medium","description":"According to a certain embodiment, the semiconductor device includes: an integrated circuit unit; a command control unit configured to execute command control for the integrated circuit unit on the ba","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11977463","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11977463","citation_suggestion":"Patentable. \"Semiconductor device and test method thereof, and non-transitory computer readable medium\" (US-11977463). https://patentable.app/patents/US-11977463","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11977463","json":"https://patentable.app/api/llm-context/US-11977463","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T12:19:42.977Z"}