{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11978498","patent":{"patent_number":"US-11978498","title":"Method and apparatus for testing adjustment circuit","assignee":null,"inventors":[],"filing_date":"2022-06-08T00:00:00.000Z","publication_date":"2024-05-07T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C"],"num_claims":17,"abstract":"A method and an apparatus for testing an adjustment circuit is applied to a test platform. The adjustment circuit includes a duty cycle adjuster (DCA) circuit. The method includes: receiving written data at a specified storage address based on a first read/write clock signal; and receiving read data from the specified storage address based on a second read/write clock signal, and generating a test result of the DCA circuit based on the written data and the read data; wherein the DCA circuit is configured to adjust a first initial read/write clock signal to generate the first read/write clock signal and/or adjust a second initial read/write clock signal to generate the second read/write clock signal, and a duty cycle of the first initial read/write clock signal and/or a duty cycle of the second initial read/write clock signal have/has a first deviation."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method and apparatus for testing adjustment circuit","description":"A method and an apparatus for testing an adjustment circuit is applied to a test platform. The adjustment circuit includes a duty cycle adjuster (DCA) circuit. The method includes: receiving written d","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11978498","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11978498","citation_suggestion":"Patentable. \"Method and apparatus for testing adjustment circuit\" (US-11978498). https://patentable.app/patents/US-11978498","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11978498","json":"https://patentable.app/api/llm-context/US-11978498","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T07:47:42.151Z"}