{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11982623","patent":{"patent_number":"US-11982623","title":"Analysis of defects of at least one type from among a plurality of types of defects between at least two samples","assignee":null,"inventors":[],"filing_date":"2019-07-30T00:00:00.000Z","publication_date":"2024-05-14T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G06T","G06T","G06T","G06T","G06T","H01L"],"num_claims":12,"abstract":"A method of analysis of defects of a type from among a plurality of types of defects between two samples based on an image of each sample characteristic of a type of defect from among the plurality of types of defects includes: for each sample, creating a minimap including bins and representative of a type of defect whose resolution is less than the image of the sample, each bin of the minimap being associated with pixels of the image of the sample and having a score dependent on the pixels and representative of the quantity of a type of defects; determining the distance between each minimap representing the same type or types of defects, the distance between two minimaps being defined as the minimum distance between two minimaps by considering the following transformations: a rotation and/or a symmetry so that each distance between two minimaps is associated with a transformation."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Analysis of defects of at least one type from among a plurality of types of defects between at least two samples","description":"A method of analysis of defects of a type from among a plurality of types of defects between two samples based on an image of each sample characteristic of a type of defect from among the plurality of","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11982623","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11982623","citation_suggestion":"Patentable. \"Analysis of defects of at least one type from among a plurality of types of defects between at least two samples\" (US-11982623). https://patentable.app/patents/US-11982623","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11982623","json":"https://patentable.app/api/llm-context/US-11982623","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T07:00:47.414Z"}