{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11984334","patent":{"patent_number":"US-11984334","title":"Anomaly detection method and system for manufacturing processes","assignee":null,"inventors":[],"filing_date":"2021-04-13T00:00:00.000Z","publication_date":"2024-05-14T00:00:00.000Z","cpc_codes":["G06Q","H01L","G05B","G05B","G05B","G05B","G06N"],"num_claims":17,"abstract":"The present disclosure describes a computer-implemented method for detecting anomalies during lot production, wherein the products within a production lot are processed according to a sequence of steps that include manufacturing steps and one or more quality control steps interspersed among the manufacturing steps, the method comprising: obtaining process quality inspection data from each of the one or more quality control steps for a first production lot; obtaining product characteristics data for the products in the first production lot after the final step in the sequence; training a Gaussian process regression model using the process quality inspection data and the product characteristics data from the first production lot; generating a predictive distribution of the product characteristics data using the Gaussian process regression model that uses a bathtub kernel function; obtaining process quality inspection data from each of the quality control steps for a second production lot; identifying anomalies in the second production lot using the predictive distribution of the product characteristics data and the process quality inspection data from the second production lot; if no anomalies are detected in the second production lot, updating the Gaussian process regression model using the process quality inspection data from the second production lot; setting target values for one or more values in the process quality inspection data based on the predictive distribution of the product characteristic; and adjusting settings of one or more manufacturing steps based on the target values."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Anomaly detection method and system for manufacturing processes","description":"The present disclosure describes a computer-implemented method for detecting anomalies during lot production, wherein the products within a production lot are processed according to a sequence of step","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11984334","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11984334","citation_suggestion":"Patentable. \"Anomaly detection method and system for manufacturing processes\" (US-11984334). https://patentable.app/patents/US-11984334","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11984334","json":"https://patentable.app/api/llm-context/US-11984334","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T04:47:51.517Z"}