{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11988590","patent":{"patent_number":"US-11988590","title":"Methods and devices for correction in particle size measurement","assignee":null,"inventors":[],"filing_date":"2020-04-27T00:00:00.000Z","publication_date":"2024-05-21T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G01N","G01N","G01N"],"num_claims":20,"abstract":"Methods and devices for correction in particle size measurement are disclosed. In some embodiments, a method includes the following steps: (1) measuring a signal from a target particle and a reference particle in a cartridge device; (2) analyzing the measured signal to obtain signal information of the target particle and signal information of the reference particle; and (3) determining size information of the target particle by correcting the signal information of the target particle with the signal information of the reference particle. In other embodiments, a device includes a cartridge and an analyzer. The analyzer is configured to receive the cartridge into the analyzer, measure a signal from the target particle and the reference particle, analyze the measured signal to obtain signal information, and determine size information of the target particle."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Methods and devices for correction in particle size measurement","description":"Methods and devices for correction in particle size measurement are disclosed. In some embodiments, a method includes the following steps: (1) measuring a signal from a target particle and a reference","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11988590","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11988590","citation_suggestion":"Patentable. \"Methods and devices for correction in particle size measurement\" (US-11988590). https://patentable.app/patents/US-11988590","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11988590","json":"https://patentable.app/api/llm-context/US-11988590","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T07:00:36.149Z"}