{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11994381","patent":{"patent_number":"US-11994381","title":"Apparatus for and method of measuring surface","assignee":null,"inventors":[],"filing_date":"2021-02-23T00:00:00.000Z","publication_date":"2024-05-28T00:00:00.000Z","cpc_codes":["G01N","G01N","G01S","G01S","G01S","G01S","G01S","G01S"],"num_claims":20,"abstract":"An apparatus for measuring a surface comprises first sensors, which are distributed two-dimensionally in space, said first sensors interacting with the surface in a contactless manner using a microwave range of electromagnetic signals, and the first sensors receive at least two of the microwave signals of the interaction with information relating to distances between the sensors and the surface as a reflection, the microwave signals of the interaction representing both dimensions of the space of two-dimensional distribution of the first sensors. A data processing unit receives said information on the distances, and determines at least one geometrical parameter of the surface on the basis of the information."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Apparatus for and method of measuring surface","description":"An apparatus for measuring a surface comprises first sensors, which are distributed two-dimensionally in space, said first sensors interacting with the surface in a contactless manner using a microwav","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11994381","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11994381","citation_suggestion":"Patentable. \"Apparatus for and method of measuring surface\" (US-11994381). https://patentable.app/patents/US-11994381","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11994381","json":"https://patentable.app/api/llm-context/US-11994381","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T16:56:35.611Z"}