{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11995812","patent":{"patent_number":"US-11995812","title":"Next generation quality inspection","assignee":null,"inventors":[],"filing_date":"2022-06-29T00:00:00.000Z","publication_date":"2024-05-28T00:00:00.000Z","cpc_codes":["G06T","G06V","G06V","G06V","G06V","G06V","G06V","H04N","H04N","G06T","G06T","G06T"],"num_claims":29,"abstract":"Methods and systems for inspecting a product, such as a wire harness, including product features for inspection. A camera of an inspection station may capture a product image. A machine learning (ML) model may detect one or more objects in the captured product image and provide, for each detected object, an identification of a class of the detected object and an identification of a region of the detected object in the captured product image. The class of the detected object may be either an acceptable product feature class or an unacceptable product feature class. The inspection station may display an enhanced product image that includes the captured product image to which the identification of the class of the detected object and the identification of the region of the detected object in the captured product image for each detected object have been added."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Next generation quality inspection","description":"Methods and systems for inspecting a product, such as a wire harness, including product features for inspection. A camera of an inspection station may capture a product image. A machine learning (ML) ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11995812","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11995812","citation_suggestion":"Patentable. \"Next generation quality inspection\" (US-11995812). https://patentable.app/patents/US-11995812","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11995812","json":"https://patentable.app/api/llm-context/US-11995812","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T14:42:06.654Z"}