{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11995817","patent":{"patent_number":"US-11995817","title":"Defect inspection method","assignee":null,"inventors":[],"filing_date":"2021-12-10T00:00:00.000Z","publication_date":"2024-05-28T00:00:00.000Z","cpc_codes":["G06T","G01N","G01N","G06V","G06V","G01N","G01N","G06T"],"num_claims":12,"abstract":"According to an embodiment, a defect inspection method is performed with a defect inspection apparatus. The defect inspection apparatus is adapted to irradiate a first sample with illumination light to acquire a first sample image, and compare the first sample image to a reference image to inspect a defect. The defect inspection method includes generating the reference image, acquiring the first sample image, setting a defect detection condition using an index based on a result of defect inspection of a second sample different from the first sample, and discriminating a nuisance from a result of comparison between the reference image and the first sample image based on the defect detection condition."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Defect inspection method","description":"According to an embodiment, a defect inspection method is performed with a defect inspection apparatus. The defect inspection apparatus is adapted to irradiate a first sample with illumination light t","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11995817","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11995817","citation_suggestion":"Patentable. \"Defect inspection method\" (US-11995817). https://patentable.app/patents/US-11995817","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11995817","json":"https://patentable.app/api/llm-context/US-11995817","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T18:03:38.171Z"}