{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-12000070","patent":{"patent_number":"US-12000070","title":"Method and system for line-by-line one dimensional fabric inspection","assignee":null,"inventors":[],"filing_date":"2019-08-21T00:00:00.000Z","publication_date":"2024-06-04T00:00:00.000Z","cpc_codes":["G01N","G01N","G06T","G06T","G06T","H04N","G01N","G06T","G06T","G06T","G06T","G06T"],"num_claims":21,"abstract":"System and method for on-loom fabric inspection includes an imaging device collecting images of a weaving area of a loom, a frame grabber receiving images of a fell-pick of and sending compact image data packages to an image processor. Irregularities may be detected by comparing a digital string representing the characteristic sequence of warp-risers and warp-sinkers along the fell-pick with a corresponding row (901) of required warp-risers and required warp-sinkers in a reference matrix (900) representing a required weaving pattern. The digital string may be a sequence of Boolean values."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method and system for line-by-line one dimensional fabric inspection","description":"System and method for on-loom fabric inspection includes an imaging device collecting images of a weaving area of a loom, a frame grabber receiving images of a fell-pick of and sending compact image d","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-12000070","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-12000070","citation_suggestion":"Patentable. \"Method and system for line-by-line one dimensional fabric inspection\" (US-12000070). https://patentable.app/patents/US-12000070","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-12000070","json":"https://patentable.app/api/llm-context/US-12000070","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T04:22:36.001Z"}