{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-12001305","patent":{"patent_number":"US-12001305","title":"Resource allocation for a memory built-in self-test","assignee":null,"inventors":[],"filing_date":"2022-08-16T00:00:00.000Z","publication_date":"2024-06-04T00:00:00.000Z","cpc_codes":["G06F","G06F","G06F","G11C","G11C","G11C","G11C"],"num_claims":25,"abstract":"Implementations described herein relate to resource allocation for a memory built-in self-test. A memory device may read one or more bits, associated with a memory built-in self-test, that are stored in a mode register of the memory device. The memory device may identify one or more memory resources of the memory device, based on reading the one or more bits, that are to be used for performing the memory built-in self-test. The one or more memory resources of the memory device may be addressable memory resources configured for performing standard memory operations of the memory device. The memory device may perform the memory built-in self-test for the memory device using the one or more memory resources of the memory device."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Resource allocation for a memory built-in self-test","description":"Implementations described herein relate to resource allocation for a memory built-in self-test. A memory device may read one or more bits, associated with a memory built-in self-test, that are stored ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-12001305","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-12001305","citation_suggestion":"Patentable. \"Resource allocation for a memory built-in self-test\" (US-12001305). https://patentable.app/patents/US-12001305","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-12001305","json":"https://patentable.app/api/llm-context/US-12001305","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T03:22:35.844Z"}