{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-12007861","patent":{"patent_number":"US-12007861","title":"Test control device, test system, and control method for device testing with predictable and reduced test times","assignee":null,"inventors":[],"filing_date":"2022-03-02T00:00:00.000Z","publication_date":"2024-06-11T00:00:00.000Z","cpc_codes":["G06F","G06F"],"num_claims":20,"abstract":"A test control device includes a test variable generation device and a test processing device. The test variable generation device uses a test prediction model to generate a first manipulated variable based on a difference between a target value and a first controlled variable value from a device under test. The test processing device acquires a second controlled variable value from the device under based on use of the first manipulated variable value. The test variable generation device notifies the device under test of end of a test if the second controlled variable value is equal to or greater than the target value or uses the test prediction model to generate a second manipulated variable based on a difference between the target value and the second controlled variable value when the second controlled variable value is less than the target value."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Test control device, test system, and control method for device testing with predictable and reduced test times","description":"A test control device includes a test variable generation device and a test processing device. The test variable generation device uses a test prediction model to generate a first manipulated variable","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-12007861","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-12007861","citation_suggestion":"Patentable. \"Test control device, test system, and control method for device testing with predictable and reduced test times\" (US-12007861). https://patentable.app/patents/US-12007861","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-12007861","json":"https://patentable.app/api/llm-context/US-12007861","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T16:57:05.620Z"}