{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8468408","patent":{"patent_number":"US-8468408","title":"Memory built-in self test (MBIST) circuitry configured to facilitate production of pre-stressed integrated circuits and methods","assignee":null,"inventors":[],"filing_date":"2010-09-16T00:00:00.000Z","publication_date":"2013-06-18T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C"],"num_claims":23,"abstract":"Integrated circuits with memory built-in self test (MBIST) circuitry and methods are disclosed that employ enhanced features. In one aspect of the invention, MBST circuitry is used set memory elements of arrays to a first state and then to an inverse state during a burn-in operation to maintain each of the two opposing states for a desired time in order to either force a failure of the integrated circuit component or produce a pre-stressed component beyond an infancy stage. Preferably, an integrated circuit is provided having MIBST circuitry configured to serially test multiple arrays of memory elements within a component of the integrated circuit and to also conduct parallel initialization of the serially tested arrays."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Memory built-in self test (MBIST) circuitry configured to facilitate production of pre-stressed integrated circuits and methods","description":"Integrated circuits with memory built-in self test (MBIST) circuitry and methods are disclosed that employ enhanced features. In one aspect of the invention, MBST circuitry is used set memory elements","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8468408","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8468408","citation_suggestion":"Patentable. \"Memory built-in self test (MBIST) circuitry configured to facilitate production of pre-stressed integrated circuits and methods\" (US-8468408). https://patentable.app/patents/US-8468408","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8468408","json":"https://patentable.app/api/llm-context/US-8468408","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T13:41:32.808Z"}