{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8479126","patent":{"patent_number":"US-8479126","title":"Parametric yield improvement flow incorporating sigma to target distance","assignee":null,"inventors":[],"filing_date":"2007-08-29T00:00:00.000Z","publication_date":"2013-07-02T00:00:00.000Z","cpc_codes":["G06F","G06F","G06F"],"num_claims":22,"abstract":"Techniques are presented for improving parametric yield. As part of an automatic sizing process for a circuit, one set of techniques receives a target value for a performance goal and then optimizes, with respect to the number of standard deviations, the distance by which the mean value of a distribution of the performance goal differs from the target value. In a second set of techniques, as part of an automatic sizing process during a circuit design process, the operation of the circuit is simulated to determine the distribution of a performance goal for a first design point. It is then determined whether a second design point is sufficiently close to the first design point and, if so, the simulation for the first design point is used for evaluating the second design point in an optimization process."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Parametric yield improvement flow incorporating sigma to target distance","description":"Techniques are presented for improving parametric yield. As part of an automatic sizing process for a circuit, one set of techniques receives a target value for a performance goal and then optimizes, ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8479126","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8479126","citation_suggestion":"Patentable. \"Parametric yield improvement flow incorporating sigma to target distance\" (US-8479126). https://patentable.app/patents/US-8479126","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8479126","json":"https://patentable.app/api/llm-context/US-8479126","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T13:25:09.014Z"}