{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8487250","patent":{"patent_number":"US-8487250","title":"Method for detecting information of an electronic potential on a sample and charged particle beam apparatus","assignee":null,"inventors":[],"filing_date":"2012-08-07T00:00:00.000Z","publication_date":"2013-07-16T00:00:00.000Z","cpc_codes":["G01N"],"num_claims":11,"abstract":"An object of the present invention is to provide a method and apparatus for measuring a potential on a surface of a sample using a charged particle beam while restraining a change in the potential on the sample induced by the charged particle beam application, or detecting a compensation value for a change in a condition for the apparatus caused by the sample being electrically charged. In order to achieve the above object, the present invention provides a method and apparatus for applying a voltage to a sample so that a charged particle beam does not reach the sample (hereinafter, this may be referred to as “mirror state”) in a state in which the charged particle beam is applied toward the sample, and detecting information relating to a potential on the sample using signals obtained by that voltage application."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for detecting information of an electronic potential on a sample and charged particle beam apparatus","description":"An object of the present invention is to provide a method and apparatus for measuring a potential on a surface of a sample using a charged particle beam while restraining a change in the potential on ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8487250","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8487250","citation_suggestion":"Patentable. \"Method for detecting information of an electronic potential on a sample and charged particle beam apparatus\" (US-8487250). https://patentable.app/patents/US-8487250","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8487250","json":"https://patentable.app/api/llm-context/US-8487250","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T20:06:20.607Z"}