{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8487935","patent":{"patent_number":"US-8487935","title":"Measuring apparatus and measuring method","assignee":null,"inventors":[],"filing_date":"2010-03-31T00:00:00.000Z","publication_date":"2013-07-16T00:00:00.000Z","cpc_codes":["G06T","G06T","G06T","G06T"],"num_claims":22,"abstract":"There is provided a technique for smoothly performing position (movement) adjustment of a waveform marker by making switching between rough adjustment and fine adjustment in a series of marker operations possible with a single means and continuously. A display control section displays a measured waveform on the two-dimensional coordinates, which have a first axis and a second axis perpendicular to the first axis, on the display section. A waveform marker is movable by a marker operation corresponding to a direction parallel to the first axis. The display control section has a detecting section, which detects the marker operation corresponding to a direction parallel to the second axis, and changes either setting of the waveform marker or the display range of the measured waveform according to the detection result of the detecting section."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Measuring apparatus and measuring method","description":"There is provided a technique for smoothly performing position (movement) adjustment of a waveform marker by making switching between rough adjustment and fine adjustment in a series of marker operati","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8487935","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8487935","citation_suggestion":"Patentable. \"Measuring apparatus and measuring method\" (US-8487935). https://patentable.app/patents/US-8487935","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8487935","json":"https://patentable.app/api/llm-context/US-8487935","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T20:57:32.575Z"}