{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8487999","patent":{"patent_number":"US-8487999","title":"Apparatus for measurement of surface profile","assignee":null,"inventors":[],"filing_date":"2009-03-30T00:00:00.000Z","publication_date":"2013-07-16T00:00:00.000Z","cpc_codes":["G01N","G01N"],"num_claims":3,"abstract":"The present invention relates to an apparatus for measurement of the surface profile detecting 2D-image of the surface of the object. The apparatus for measurement of the surface profile according to the present invention comprises a first light source illuminating a first one-color light to the surface of the object; a second light source illuminating a second one-color light of which color is different from the first one-color light to the surface of the object; a black-and-white camera capturing the first one-color light and the second one-color light reflected from the surface of the object, which are illuminated from the first light source and the second light source; and a controller controlling the first light source, the second light source and the black-and-white camera to obtain a first black-and-white image data and a second black-and-white image data corresponding to the first one-color light and the second one-color light respectively in the state that the first one-color light and the second one-color light are illuminated to the surface of the object, and generating a synthesized color image of the surface of the object using the first black-and-white image data and the second black-and-white image data. Thus, it is possible to obtain the color 2D-image using the low-priced black-and-white camera, and it is also possible to improve processing speed by means of using the black-and-white camera of which processing speed is faster than that of a color camera."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Apparatus for measurement of surface profile","description":"The present invention relates to an apparatus for measurement of the surface profile detecting 2D-image of the surface of the object. The apparatus for measurement of the surface profile according to ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8487999","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8487999","citation_suggestion":"Patentable. \"Apparatus for measurement of surface profile\" (US-8487999). https://patentable.app/patents/US-8487999","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8487999","json":"https://patentable.app/api/llm-context/US-8487999","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T01:50:24.588Z"}