{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8488380","patent":{"patent_number":"US-8488380","title":"Word line driving circuit, semiconductor memory device including the same, and method for testing the semiconductor memory device","assignee":null,"inventors":[],"filing_date":"2011-10-17T00:00:00.000Z","publication_date":"2013-07-16T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C","G11C"],"num_claims":7,"abstract":"A semiconductor memory device in accordance with the present invention is able to facilitate detecting whether a word line fails or not by floating the word line. The semiconductor memory device includes a word line driver, and a floating controller. The word line driver is configured to control a word line to be enabled/disabled. The floating controller is configured to control the word line driver to float the word line in response to a word line floating signal."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Word line driving circuit, semiconductor memory device including the same, and method for testing the semiconductor memory device","description":"A semiconductor memory device in accordance with the present invention is able to facilitate detecting whether a word line fails or not by floating the word line. The semiconductor memory device inclu","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8488380","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8488380","citation_suggestion":"Patentable. \"Word line driving circuit, semiconductor memory device including the same, and method for testing the semiconductor memory device\" (US-8488380). https://patentable.app/patents/US-8488380","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8488380","json":"https://patentable.app/api/llm-context/US-8488380","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T20:58:12.399Z"}