{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8489530","patent":{"patent_number":"US-8489530","title":"System and method for root cause analysis of the failure of a manufactured product","assignee":null,"inventors":[],"filing_date":"2008-12-03T00:00:00.000Z","publication_date":"2013-07-16T00:00:00.000Z","cpc_codes":["G06N"],"num_claims":21,"abstract":"A system, method and computer program product for the root cause analysis of the failure of a manufactured product is disclosed. The present invention includes the development of a knowledge model, based on information obtained from historical warranty claim forms and various manufacturing data sources. The invention also includes processing text information in a free-form text that is obtained from warranty claim forms by using text-tagging and annotation techniques. Thereafter, the knowledge model is converted to a Bayesian network. The present invention provides a user interface to select parameters and corresponding instances from current warranty claim forms. The selected parameters and corresponding instances are used as input evidence for the Bayesian network. The present invention facilitates the process of drawing inferences for root cause analysis of the failure of manufactured products and corresponding probabilities."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"System and method for root cause analysis of the failure of a manufactured product","description":"A system, method and computer program product for the root cause analysis of the failure of a manufactured product is disclosed. The present invention includes the development of a knowledge model, ba","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8489530","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8489530","citation_suggestion":"Patentable. \"System and method for root cause analysis of the failure of a manufactured product\" (US-8489530). https://patentable.app/patents/US-8489530","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8489530","json":"https://patentable.app/api/llm-context/US-8489530","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T15:33:30.392Z"}