{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8494811","patent":{"patent_number":"US-8494811","title":"Device management method, analysis system used for the device management method, analysis data structure, and maintenance inspection support apparatus used for the device management method","assignee":null,"inventors":[],"filing_date":"2006-07-25T00:00:00.000Z","publication_date":"2013-07-23T00:00:00.000Z","cpc_codes":["G06Q","G07C"],"num_claims":3,"abstract":"A service condition, a cause of a malfunction, or another aspect of a device in a large group of devices to be managed can be analyzed in an accurate and efficient manner. A complete test involving the entire number of devices in a large group of managed devices (T) is periodically performed to determine whether the devices are operating normally or have a malfunction; a test result (Ic) is recorded for each cycle of the complete test, and a device that has been found to be malfunctioning is repaired or replaced; and analysis data G, E are created showing a malfunctioning frequency (N) of each of the managed devices (T) on the basis of the test result (Ic) of the complete test that spans a plurality of cycles."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Device management method, analysis system used for the device management method, analysis data structure, and maintenance inspection support apparatus used for the device management method","description":"A service condition, a cause of a malfunction, or another aspect of a device in a large group of devices to be managed can be analyzed in an accurate and efficient manner. A complete test involving th","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8494811","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8494811","citation_suggestion":"Patentable. \"Device management method, analysis system used for the device management method, analysis data structure, and maintenance inspection support apparatus used for the device management method\" (US-8494811). https://patentable.app/patents/US-8494811","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8494811","json":"https://patentable.app/api/llm-context/US-8494811","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T23:05:51.241Z"}