{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8495479","patent":{"patent_number":"US-8495479","title":"Defect detection and correction via monitoring of syndromes and bit  flips in decoder","assignee":null,"inventors":[],"filing_date":"2011-11-18T00:00:00.000Z","publication_date":"2013-07-23T00:00:00.000Z","cpc_codes":["G06F"],"num_claims":18,"abstract":"A defect detection and correction system includes a decoder module configured to decode data received from a data storage device and output the data and a plurality of confidence indicators associated with respective bits of the data. A digital defect detection module is configured to compare each of the confidence indicators in a window of W bits of the data to a confidence threshold, identify a number of bits in the window of W bits as defective based on the comparison, mark all of the bits in the window of W bits as defective if the number of bits is greater than a bit threshold, and generate a defect indicator identifying the window of W bits as defective."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Defect detection and correction via monitoring of syndromes and bit  flips in decoder","description":"A defect detection and correction system includes a decoder module configured to decode data received from a data storage device and output the data and a plurality of confidence indicators associated","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8495479","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8495479","citation_suggestion":"Patentable. \"Defect detection and correction via monitoring of syndromes and bit  flips in decoder\" (US-8495479). https://patentable.app/patents/US-8495479","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8495479","json":"https://patentable.app/api/llm-context/US-8495479","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T22:11:22.012Z"}