{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8496373","patent":{"patent_number":"US-8496373","title":"Method of infrared inspection for structure, test specimen for infrared inspection and heat conductive member","assignee":null,"inventors":[],"filing_date":"2009-08-24T00:00:00.000Z","publication_date":"2013-07-30T00:00:00.000Z","cpc_codes":["G01N"],"num_claims":9,"abstract":"A test specimen having a to-be-photographed surface and an attachment surface which is a back side thereof is produced, and attached to a structure. An artificial abnormal portion is provided between a to-be-inspected surface of the structure and the to-be-photographed surface of the test specimen. The to-be-photographed surface of the test specimen is photographed by the infrared camera. When a surface temperature difference between the abnormal and the sound portions increases to a certain level on the to-be-photographed surface, it is capable of discriminating between the abnormal and the sound portions by an infrared thermal image of the test specimen. In a time zone in which discriminating between the abnormal and the sound portions is capable, the to-be-inspected surface of the structure is photographed by the infrared camera. If there is a damage in the surface layer of the structure, a damaged position can be discriminated by an infrared thermal image."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method of infrared inspection for structure, test specimen for infrared inspection and heat conductive member","description":"A test specimen having a to-be-photographed surface and an attachment surface which is a back side thereof is produced, and attached to a structure. An artificial abnormal portion is provided between ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8496373","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8496373","citation_suggestion":"Patentable. \"Method of infrared inspection for structure, test specimen for infrared inspection and heat conductive member\" (US-8496373). https://patentable.app/patents/US-8496373","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8496373","json":"https://patentable.app/api/llm-context/US-8496373","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T10:31:59.941Z"}