{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8498831","patent":{"patent_number":"US-8498831","title":"Semiconductor device, semiconductor device testing method, and data processing system","assignee":null,"inventors":[],"filing_date":"2010-10-08T00:00:00.000Z","publication_date":"2013-07-30T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C","H01L","H01L","H01L"],"num_claims":45,"abstract":"To include one or a plurality of internal signal lines that electrically connects an interface chip to a core chip. The interface chip includes a first circuit that outputs a current to an internal wiring and the core chip includes a second circuit that outputs a current to the first internal signal line. The interface chip includes a determination circuit that has a first input terminal connected to the internal wiring through which the current outputted by the first circuit flows and a second input terminal connected to an end of the first internal signal line in the interface chip, and outputs a voltage according to a potential difference between a voltage of the first input terminal and a voltage of the second input terminal."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor device, semiconductor device testing method, and data processing system","description":"To include one or a plurality of internal signal lines that electrically connects an interface chip to a core chip. The interface chip includes a first circuit that outputs a current to an internal wi","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8498831","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8498831","citation_suggestion":"Patentable. \"Semiconductor device, semiconductor device testing method, and data processing system\" (US-8498831). https://patentable.app/patents/US-8498831","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8498831","json":"https://patentable.app/api/llm-context/US-8498831","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T16:25:23.227Z"}