{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8504882","patent":{"patent_number":"US-8504882","title":"Circuitry on an integrated circuit for performing or facilitating oscilloscope, jitter, and/or bit-error-rate tester operations","assignee":null,"inventors":[],"filing_date":"2010-09-17T00:00:00.000Z","publication_date":"2013-08-06T00:00:00.000Z","cpc_codes":["G06F"],"num_claims":28,"abstract":"An integrated circuit (“IC”) includes circuitry for use in testing a serial data signal. One such IC includes circuitry for transmitting the serial data signal with optional jitter, optional noise, and/or controllably variable drive strength. One such IC also includes circuitry for receiving the serial data signal and performing a bit error rate (“BER”) analysis in such a signal. Such an IC provides output signals indicative of results of its operations. One such IC operates in various modes to perform or at least emulate functions of an oscilloscope, a bit error rate tester, etc., for testing signals and circuitry with respect to jitter-tolerance, noise-tolerance, etc."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Circuitry on an integrated circuit for performing or facilitating oscilloscope, jitter, and/or bit-error-rate tester operations","description":"An integrated circuit (“IC”) includes circuitry for use in testing a serial data signal. One such IC includes circuitry for transmitting the serial data signal with optional jitter, optional noise, an","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8504882","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8504882","citation_suggestion":"Patentable. \"Circuitry on an integrated circuit for performing or facilitating oscilloscope, jitter, and/or bit-error-rate tester operations\" (US-8504882). https://patentable.app/patents/US-8504882","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8504882","json":"https://patentable.app/api/llm-context/US-8504882","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T19:08:00.390Z"}