{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8508279","patent":{"patent_number":"US-8508279","title":"Semiconductor device, and method of diagnosing abnormality of boosting circuit of semiconductor device","assignee":null,"inventors":[],"filing_date":"2011-09-19T00:00:00.000Z","publication_date":"2013-08-13T00:00:00.000Z","cpc_codes":["H02J","H02J","H02J"],"num_claims":20,"abstract":"The battery monitoring IC is provided with the short circuiting switch that includes the switching element that shorts the input side and the output side of the boosting circuit that boosts the power supply voltage to the driving voltage, that can drive the MOS transistor within the buffer amplifier in the saturated region, and supplies the driving voltage as the driving voltage of the buffer amplifier. An abnormality of the boosting circuit can be diagnosed by comparing the output voltage, that is measured when the short circuiting switch is turned off and the driving voltage boosted by the boosting circuit is supplied to the buffer amplifier, and the output voltage, that is measured when the short circuiting switch is turned on and the power supply voltage is, without going through the boosting circuit, supplied as is to the buffer amplifier."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor device, and method of diagnosing abnormality of boosting circuit of semiconductor device","description":"The battery monitoring IC is provided with the short circuiting switch that includes the switching element that shorts the input side and the output side of the boosting circuit that boosts the power ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8508279","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8508279","citation_suggestion":"Patentable. \"Semiconductor device, and method of diagnosing abnormality of boosting circuit of semiconductor device\" (US-8508279). https://patentable.app/patents/US-8508279","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8508279","json":"https://patentable.app/api/llm-context/US-8508279","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T21:22:44.316Z"}