{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8509006","patent":{"patent_number":"US-8509006","title":"Semiconductor device and method of detecting abnormality on semiconductor device","assignee":null,"inventors":[],"filing_date":"2011-02-03T00:00:00.000Z","publication_date":"2013-08-13T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C","G11C","G11C","G11C"],"num_claims":11,"abstract":"A semiconductor device includes: a plurality of word lines; a word line driver; a first detection circuit; and a control circuit. The plurality of word lines is connected to gates of a plurality of memory cell transistors, respectively. The word line driver supplies one of a selection voltage and a non-selection voltage to each of the plurality of word lines. The first detection circuit detects a first current flowing into the word line driver through a wiring supplying the selection voltage when the selection voltage is supplied to one of the plurality of word lines through the word line driver. The control circuit detects abnormality of the plurality of word lines and the word line driver based on the first current."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor device and method of detecting abnormality on semiconductor device","description":"A semiconductor device includes: a plurality of word lines; a word line driver; a first detection circuit; and a control circuit. The plurality of word lines is connected to gates of a plurality of me","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8509006","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8509006","citation_suggestion":"Patentable. \"Semiconductor device and method of detecting abnormality on semiconductor device\" (US-8509006). https://patentable.app/patents/US-8509006","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8509006","json":"https://patentable.app/api/llm-context/US-8509006","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T11:57:42.199Z"}