{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8510692","patent":{"patent_number":"US-8510692","title":"Verification system and method using constrained random test parameter selection","assignee":null,"inventors":[],"filing_date":"2011-09-29T00:00:00.000Z","publication_date":"2013-08-13T00:00:00.000Z","cpc_codes":["G06F"],"num_claims":13,"abstract":"A software program for verifying a system design having at least one integrated circuit chip. The software program, when executed by a processor, result in obtaining a random value for a variable; selecting an unused value for the variable based upon the random value, the variable not having been assigned the unused value during one or more prior verification tests; and creating a new verification test for the system using the unused value for the variable. In this way, the new verification test is created in which variables falling within a random class are more efficiently used."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Verification system and method using constrained random test parameter selection","description":"A software program for verifying a system design having at least one integrated circuit chip. The software program, when executed by a processor, result in obtaining a random value for a variable; sel","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8510692","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8510692","citation_suggestion":"Patentable. \"Verification system and method using constrained random test parameter selection\" (US-8510692). https://patentable.app/patents/US-8510692","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8510692","json":"https://patentable.app/api/llm-context/US-8510692","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T00:17:28.717Z"}