{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8515153","patent":{"patent_number":"US-8515153","title":"System and method of image processing, and scanning electron microscope","assignee":null,"inventors":[],"filing_date":"2011-12-21T00:00:00.000Z","publication_date":"2013-08-20T00:00:00.000Z","cpc_codes":["G06T","G06V","G06T"],"num_claims":18,"abstract":"A scanning electron microscope comprises an image processing system for carrying out a pattern matching between a first image and a second image. The image processing system comprises: a paint-divided image generator for generating a paint divided image based on the first image; a gravity point distribution image generator for carrying out a smoothing process of the paint divided image and generating a gravity point distribution image; an edge line segment group generation unit for generating a group of edge line segments based on the second image; a matching score calculation unit for calculating a matching score based on the gravity point distribution image and the group of edge line segments; and a maximum score position detection unit for detecting a position where the matching score becomes the maximum."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"System and method of image processing, and scanning electron microscope","description":"A scanning electron microscope comprises an image processing system for carrying out a pattern matching between a first image and a second image. The image processing system comprises: a paint-divided","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8515153","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8515153","citation_suggestion":"Patentable. \"System and method of image processing, and scanning electron microscope\" (US-8515153). https://patentable.app/patents/US-8515153","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8515153","json":"https://patentable.app/api/llm-context/US-8515153","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T16:55:06.285Z"}