{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8519722","patent":{"patent_number":"US-8519722","title":"Method and apparatus for testing projected capacitance matrices and determining the location and types of faults","assignee":null,"inventors":[],"filing_date":"2009-10-22T00:00:00.000Z","publication_date":"2013-08-27T00:00:00.000Z","cpc_codes":["G06F","G06F"],"num_claims":21,"abstract":"A method, system and apparatus is described for measuring a sensor, comparing measured values of a sensor to a reference value, adjusting a calibration parameter in response to the comparing of measured values to a reference value and determining sensor integrity based on the value o the adjusted parameter."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method and apparatus for testing projected capacitance matrices and determining the location and types of faults","description":"A method, system and apparatus is described for measuring a sensor, comparing measured values of a sensor to a reference value, adjusting a calibration parameter in response to the comparing of measur","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8519722","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8519722","citation_suggestion":"Patentable. \"Method and apparatus for testing projected capacitance matrices and determining the location and types of faults\" (US-8519722). https://patentable.app/patents/US-8519722","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8519722","json":"https://patentable.app/api/llm-context/US-8519722","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T20:30:59.355Z"}