{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8537151","patent":{"patent_number":"US-8537151","title":"Inspection method","assignee":null,"inventors":[],"filing_date":"2012-05-02T00:00:00.000Z","publication_date":"2013-09-17T00:00:00.000Z","cpc_codes":["G09G","G09G","G09G","G09G"],"num_claims":16,"abstract":"An inspection method for an active-matrix substrate including the scanning lines, the data lines, the pixels disposed in matrix, and the power lines. The pixel includes: an organic EL device; a drive transistor; a capacitor; a selection transistor having a gate connected to the scanning line and connected between the data line and the gate of the drive transistor, and the guard potential transistor having a gate connected to a source of the selection transistor, a source connected to a drain of the selection transistor, and a drain connected to the power line. The inspection method includes: a writing process for writing a charge in the capacitor; a reading process for reading the written charged from the capacitor; and a holding process for holding the charge for a predetermined period from the end of the writing process to the start of the reading process."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Inspection method","description":"An inspection method for an active-matrix substrate including the scanning lines, the data lines, the pixels disposed in matrix, and the power lines. The pixel includes: an organic EL device; a drive ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8537151","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8537151","citation_suggestion":"Patentable. \"Inspection method\" (US-8537151). https://patentable.app/patents/US-8537151","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8537151","json":"https://patentable.app/api/llm-context/US-8537151","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T21:20:20.489Z"}