{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8537629","patent":{"patent_number":"US-8537629","title":"Method of testing bitline in non-volatile memory device","assignee":null,"inventors":[],"filing_date":"2012-07-03T00:00:00.000Z","publication_date":"2013-09-17T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C"],"num_claims":4,"abstract":"A method of testing bitlines in a non-volatile memory device is introduced. The non-volatile memory device includes a memory cell array and a plurality of bitlines crossing the memory cell array. Each of the bitlines has a first end and a second end. The bitlines are divided into a first group and a second group. The testing method includes applying a supply voltage (for charging) or a ground voltage (for discharging) to a specific group of bitlines. The bitlines are tested in two testing stages, namely an open-circuit bitline test and a short-circuit bitline test, based on the feature that a defective bitline cannot be charged or discharged. The open-circuit bitline test and the short-circuit bitline test are quick and dispense with a lengthy programmed/erasing process."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method of testing bitline in non-volatile memory device","description":"A method of testing bitlines in a non-volatile memory device is introduced. The non-volatile memory device includes a memory cell array and a plurality of bitlines crossing the memory cell array. Each","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8537629","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8537629","citation_suggestion":"Patentable. \"Method of testing bitline in non-volatile memory device\" (US-8537629). https://patentable.app/patents/US-8537629","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8537629","json":"https://patentable.app/api/llm-context/US-8537629","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T13:13:39.501Z"}