{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8538119","patent":{"patent_number":"US-8538119","title":"Particle image analysis method and apparatus","assignee":null,"inventors":[],"filing_date":"2009-05-12T00:00:00.000Z","publication_date":"2013-09-17T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G01N"],"num_claims":14,"abstract":"A particle image analyzing method is adapted so that while raising image-reviewing efficiency at a cropped image level of particle components in a sample, the entire sample can be observed without significantly changing a related apparatus configuration. Prior to image reviewing of an imaging region, cropped images thereof are reviewed and, with reference to the images arranged for each kind of particle component, if the operator judges any particles to have been falsely identified, the operator uses an operating unit to modify positions of the particles to those of correct component items. An overall image of the imaging region is displayed and if any components to be added (overlooked components) appear, the kinds of these components are identified and quantitative data on each kind of component is registered. Upon completion of the registration, the concentration of the sample is recalculated and a comment is entered in a comment field."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Particle image analysis method and apparatus","description":"A particle image analyzing method is adapted so that while raising image-reviewing efficiency at a cropped image level of particle components in a sample, the entire sample can be observed without sig","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8538119","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8538119","citation_suggestion":"Patentable. \"Particle image analysis method and apparatus\" (US-8538119). https://patentable.app/patents/US-8538119","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8538119","json":"https://patentable.app/api/llm-context/US-8538119","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T21:13:26.707Z"}