{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8538131","patent":{"patent_number":"US-8538131","title":"Defect inspection apparatus and method of defect inspection","assignee":null,"inventors":[],"filing_date":"2006-08-29T00:00:00.000Z","publication_date":"2013-09-17T00:00:00.000Z","cpc_codes":["G01N","G01N","G06T","G01N","G06T"],"num_claims":4,"abstract":"A first defect classification section uses a pre-inspection test target as the inspected piece, and classifies the defects, based on results of the defect inspection executed a plurality of times by the defect detection system, into first defects detected constantly in each of the plurality of times of inspection, and into second defects detected only in a part of, but not in the residual part of the plurality of times of inspection."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Defect inspection apparatus and method of defect inspection","description":"A first defect classification section uses a pre-inspection test target as the inspected piece, and classifies the defects, based on results of the defect inspection executed a plurality of times by t","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8538131","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8538131","citation_suggestion":"Patentable. \"Defect inspection apparatus and method of defect inspection\" (US-8538131). https://patentable.app/patents/US-8538131","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8538131","json":"https://patentable.app/api/llm-context/US-8538131","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T23:57:09.758Z"}