{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8538726","patent":{"patent_number":"US-8538726","title":"Three dimensional shape measurement apparatus, three dimensional shape measurement method, and computer program","assignee":null,"inventors":[],"filing_date":"2010-05-14T00:00:00.000Z","publication_date":"2013-09-17T00:00:00.000Z","cpc_codes":["G06T"],"num_claims":9,"abstract":"A 3D shape measurement apparatus for measuring a 3D shape of an object existing on a measurement area, comprising, a pattern projection unit for projecting a pattern having a periodicity onto the measurement area, and a capturing unit for capturing an image of the area where the pattern is projected, wherein the measurement area is specified by a reference plane, a projection area of the pattern projection unit, and a capturing area of the capturing unit, and the pattern projection unit projects the pattern to be focused on the reference plane. The apparatus further comprises a first calculation unit for calculating phase information of a pattern of the captured image, a second calculation unit for calculating defocus amounts of the pattern in the captured image, and a third calculation unit for calculating a 3D shape of the object based on the phase information and the defocus amounts."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Three dimensional shape measurement apparatus, three dimensional shape measurement method, and computer program","description":"A 3D shape measurement apparatus for measuring a 3D shape of an object existing on a measurement area, comprising, a pattern projection unit for projecting a pattern having a periodicity onto the meas","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8538726","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8538726","citation_suggestion":"Patentable. \"Three dimensional shape measurement apparatus, three dimensional shape measurement method, and computer program\" (US-8538726). https://patentable.app/patents/US-8538726","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8538726","json":"https://patentable.app/api/llm-context/US-8538726","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T15:55:14.888Z"}