{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8539289","patent":{"patent_number":"US-8539289","title":"Memory testing system and method of computing device","assignee":null,"inventors":[],"filing_date":"2011-12-07T00:00:00.000Z","publication_date":"2013-09-17T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C","G11C"],"num_claims":15,"abstract":"In a memory testing method for testing a memory module of a computing device, an operating voltage of the memory module is adjusted to a first voltage or a second voltage. A predetermined data set is written into the memory module after the operating voltage of the memory module is adjusted, and the written data set is read out from the memory module, to accomplish a data writing and reading process of the memory module. A register value that presents how many memory errors have occurred during the data writing and reading process is acquired from an ECC register of the memory module, to determine whether the memory module is stable during the adjusting of the operating voltage according to the register value."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Memory testing system and method of computing device","description":"In a memory testing method for testing a memory module of a computing device, an operating voltage of the memory module is adjusted to a first voltage or a second voltage. A predetermined data set is ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8539289","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8539289","citation_suggestion":"Patentable. \"Memory testing system and method of computing device\" (US-8539289). https://patentable.app/patents/US-8539289","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8539289","json":"https://patentable.app/api/llm-context/US-8539289","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T01:54:32.392Z"}