{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8539423","patent":{"patent_number":"US-8539423","title":"Systematic benchmarking system and method for standardized data creation, analysis and comparison of semiconductor technology node characteristics","assignee":null,"inventors":[],"filing_date":"2012-10-11T00:00:00.000Z","publication_date":"2013-09-17T00:00:00.000Z","cpc_codes":["G06F","G06F","G06F","G06F","G06F"],"num_claims":10,"abstract":"One aspect provides a method of designing an integrated circuit. In one embodiment, the method includes: (1) generating a functional design for the integrated circuit, (2) determining performance objectives for the integrated circuit, (3) determining an optimization target voltage for the integrated circuit, (4) determining whether the integrated circuit needs voltage scaling to achieve the performance objectives at the optimization target voltage and, if so, whether the integrated circuit is to employ static voltage scaling or adaptive voltage scaling, (5) using the optimization target voltage to synthesize a layout from the functional integrated circuit design that meets the performance objectives by employing standardized data created by designing at least one representative benchmark circuit, and (6) performing a timing signoff of the layout at the optimization target voltage."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Systematic benchmarking system and method for standardized data creation, analysis and comparison of semiconductor technology node characteristics","description":"One aspect provides a method of designing an integrated circuit. In one embodiment, the method includes: (1) generating a functional design for the integrated circuit, (2) determining performance obje","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8539423","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8539423","citation_suggestion":"Patentable. \"Systematic benchmarking system and method for standardized data creation, analysis and comparison of semiconductor technology node characteristics\" (US-8539423). https://patentable.app/patents/US-8539423","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8539423","json":"https://patentable.app/api/llm-context/US-8539423","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T17:15:36.080Z"}