{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-8542876","patent":{"patent_number":"US-8542876","title":"Methods and systems for enhancing backscatter X-ray foreign object debris detection","assignee":null,"inventors":[],"filing_date":"2011-03-28T00:00:00.000Z","publication_date":"2013-09-24T00:00:00.000Z","cpc_codes":["G01N"],"num_claims":20,"abstract":"A method for detecting an anomaly associated with a structure is described. The method includes obtaining a baseline scan of the structure, changing at least one condition associated with the structure which is intended to impart a movement of the structure or a movement of objects within the structure, obtaining a secondary scan of the structure, the secondary scan obtained from a same position, with respect to the structure, as the baseline scan, determining any differences between the baseline scan and the secondary scan, and identifying at least one of a foreign object proximate the structure and a structural anomaly associated with the structure based on any differences between the baseline scan and the secondary scan."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Methods and systems for enhancing backscatter X-ray foreign object debris detection","description":"A method for detecting an anomaly associated with a structure is described. The method includes obtaining a baseline scan of the structure, changing at least one condition associated with the structur","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-8542876","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-8542876","citation_suggestion":"Patentable. \"Methods and systems for enhancing backscatter X-ray foreign object debris detection\" (US-8542876). https://patentable.app/patents/US-8542876","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-8542876","json":"https://patentable.app/api/llm-context/US-8542876","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T00:15:39.967Z"}