{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9596027","patent":{"patent_number":"US-9596027","title":"Signal deformation measurement on polarization-multiplexed signals","assignee":null,"inventors":[],"filing_date":"2014-05-02T00:00:00.000Z","publication_date":"2017-03-14T00:00:00.000Z","cpc_codes":["H04B","H04J"],"num_claims":21,"abstract":"There is provided a method and an apparatus for determining quality parameters on a polarization-multiplexed optical signal based on an analysis of the power spectral density of the Signal-Under-Test (SUT). The method is predicated upon knowledge of the spectral shape of the signal in the absence of significant noise or spectral deformation. This knowledge is provided by a reference optical spectrum trace. Based on this knowledge and under the assumption that ASE noise level is approximately constant in wavelength over a given spectral range, the spectral deformation of the signal contribution of the SUT may be estimated using a comparison of the spectral variations of the optical spectrum trace of the SUT with that of the reference optical spectrum trace."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Signal deformation measurement on polarization-multiplexed signals","description":"There is provided a method and an apparatus for determining quality parameters on a polarization-multiplexed optical signal based on an analysis of the power spectral density of the Signal-Under-Test ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9596027","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9596027","citation_suggestion":"Patentable. \"Signal deformation measurement on polarization-multiplexed signals\" (US-9596027). https://patentable.app/patents/US-9596027","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9596027","json":"https://patentable.app/api/llm-context/US-9596027","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T05:46:56.752Z"}