{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-9601393","patent":{"patent_number":"US-9601393","title":"Selecting one or more parameters for inspection of a wafer","assignee":null,"inventors":[],"filing_date":"2010-02-05T00:00:00.000Z","publication_date":"2017-03-21T00:00:00.000Z","cpc_codes":["H01L","G01N","H01L","H01L"],"num_claims":69,"abstract":"Computer-implemented methods, computer-readable media, and systems for selecting one or more parameters for inspection of a wafer are provided."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Selecting one or more parameters for inspection of a wafer","description":"Computer-implemented methods, computer-readable media, and systems for selecting one or more parameters for inspection of a wafer are provided.","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-9601393","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-9601393","citation_suggestion":"Patentable. \"Selecting one or more parameters for inspection of a wafer\" (US-9601393). https://patentable.app/patents/US-9601393","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-9601393","json":"https://patentable.app/api/llm-context/US-9601393","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-06-06T11:18:54.814Z"}